Job Description

• Develop full chip test methods, on-chip DFT Design-for-Test definition and verification, test vector generation and coverage analysis, ATE program development, and 1st silicon debug for Intel's FPGA products.
• Collaborate with worldwide cross-functional teams including designers, software, manufacturing, and product engineering, as you drive for test capability throughout the entire product development cycle.
• Drive test optimizations to reduce test cost, enhance product quality, improve manufacturing efficiency and accelerate manufacturing stability.
• Develop CMT/HMDT test module, conversion test pattern from STIL to pobj, doing test program validation on tester.

Qualifications:

• BS/MS in Electrical Engineering or equivalent, with a minimum of 8-10 years industry experience in IC Design, IC Test, or equivalent field.
• Expert understanding of memory test methodology for SOC and/or FPGAs.
• Proven experience in DFT definition development
• Silicon bring-up and ATE experience is preferred.
• Strong digital or analog circuit fundamentals.
• Well versed in test industry trends and technology.
• Self-motivated, with proven collaboration and leadership skills.

Job Type:

Regular

Shift:

Shift 1 (Malaysia)

Primary Location:

Penang 15, Penang, Malaysia

Additional Locations:

Posting Statement:

All qualified applicants will receive consideration for employment without regard to race, color, religion, religious creed, sex, national origin, ancestry, age, physical or mental disability, medical condition, genetic information, military and veteran status, marital status, pregnancy, gender, gender expression, gender identity, sexual orientation, or any other characteristic protected by local law, regulation, or ordinance.